First Atomic Force Microscope (AFM) image of atomic steps on silicon produced directly by diode laser interferometer

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来源：
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 1999年 / 104卷 / 05期
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TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：507 / 507
页数：1
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