Polymer melts and polymer solutions near patterned surfaces

被引:21
|
作者
Seok, C
Freed, KF
Szleifer, I
机构
[1] Univ Chicago, Dept Chem, Chicago, IL 60637 USA
[2] Univ Chicago, James Franck Inst, Chicago, IL 60637 USA
[3] Purdue Univ, Dept Chem, W Lafayette, IN 47907 USA
来源
JOURNAL OF CHEMICAL PHYSICS | 2000年 / 112卷 / 14期
关键词
D O I
10.1063/1.481206
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present analytical solutions for density profiles of homopolymer melts and of the mathematically equivalent, incompressible polymer solutions near heterogenous, periodically patterned surfaces. The theory employs an analytic density functional-self-consistent field theory, and particular applications consider striped and checkerboard patterns. The computations illustrate the competing influences of the pattern size and the bulk correlation length xi on the density profile both at the surface and orthogonal to the surface. The density profiles are determined by the bulk correlation length xi if the thickness of the stripes L is larger than 2 xi and by L if L < 2 xi. (C) 2000 American Institute of Physics. [S0021-9606(00)51713-9].
引用
收藏
页码:6443 / 6451
页数:9
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