Single nanoparticle measurement techniques

被引：73
作者：
Wernsdorfer, W
Mailly, D
Benoit, A
机构：
[1] Univ Grenoble 1, CNRS, Lab Louis Neel, F-38042 Grenoble 9, France
[2] CNRS, Microstruct & Microelect Lab, F-92220 Bagneux, France
[3] Univ Grenoble 1, CNRS, CRTBT, F-38042 Grenoble 9, France
来源：
JOURNAL OF APPLIED PHYSICS | 2000年 / 87卷 / 09期
关键词：
D O I：
10.1063/1.373259
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Various single particle measuring techniques are briefly reviewed and the basic concepts of a new microsuperconducting quantum interference device technique are discussed. It allows measurements of the magnetization reversal of single nanometer-sized particles at low temperature. The influence of the measuring technique on the system of interest is discussed. (C) 2000 American Institute of Physics. [S0021-8979(00)36608-7].
引用
收藏
页码：5094 / 5096
页数：3
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