Stress change in YBa2Cu3O7-δ close to the superconducting transition -: art. no. 054511

被引：8
|
作者：
Cao, LX
Kremer, RK
Qin, YL
Brötz, J
Liu, JS
Zegenhagen, J
机构：
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[3] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[4] Tech Univ Darmstadt, FB Mat Wissensch, FG Strukturforsch, D-64287 Darmstadt, Germany
[5] Tsinghua Univ, Inst Microelect, Beijing 100084, Peoples R China
来源：
PHYSICAL REVIEW B | 2002年 / 66卷 / 05期
关键词：
D O I：
10.1103/PhysRevB.66.054511
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Measurements on Au/Pb(Zr1-xTix)O-3/YBa2Cu3O7-delta (x=0.47,0) thin film capacitor structures on SrTiO3(001) reveal a jump up to approximate to30% in the dielectric constant of the ferroelectric Pb(Zr0.53Ti0.47)O-3 films, which starts about 10 K above the superconducting transition of the underlying YBa2Cu3O7-delta layer. We show that this can be understood by a stress release in the ferroelectric film which must be caused by a stress change in the high-temperature superconductor starting already significantly above T-c.
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页码：1 / 7
页数：7
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