Electronic structure of Ni complexes by X-ray resonance Raman spectroscopy (resonant inelastic X-ray scattering)

被引：29
作者：
Glatzel, P [1 ]
Bergmann, U
Gu, WW
Wang, HX
Stepanov, S
Mandimutsira, BS
Riordan, CG
Horwitz, CP
Collins, T
Cramer, SP
机构：
[1] Univ Calif Davis, Dept Appl Sci, Davis, CA 95616 USA
[2] Carnegie Mellon Univ, Dept Chem, Pittsburgh, PA 15213 USA
[3] Univ Delaware, Dept Chem, Newark, DE 19716 USA
[4] Argonne Natl Lab, Adv Photon Source, BioCAT, Argonne, IL 60439 USA
[5] Lawrence Berkeley Lab, Berkeley, CA 94720 USA
来源：
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2002年 / 124卷 / 33期
关键词：
D O I：
10.1021/ja026028n
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The potential of 1s2p resonant inelastic (Raman) X-ray scattering (RIXS) is demonstrated for a series of Ni coordination complexes. In this technique, incident and scattered photon energies lie in the hard X-ray range (>5 keV). The 1s2p RIXS contour plots provide information that is complementary to K-edge and L-edge spectroscopy. RIXS spectroscopy promises to be a valuable probe of electronic structure. Copyright © 2002 American Chemical Society.
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收藏
页码：9668 / 9669
页数：2
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