X-ray resonant Raman scattering from noble gas atoms and beyond

被引：8

作者：

Zitnik, M. ^{[1
]}

Kavcic, M. ^{[1
]}

Bucar, K. ^{[1
]}

Mihelic, A. ^{[1
]}

机构：

[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 02期

关键词：

High resolution X-ray spectroscopy; Inelastic X-ray scattering; Resonant X-ray scattering; ARGON; DECAY; EXCITATIONS; HELIUM; SULFUR; XENON; STATE; EDGE;

D O I：

10.1016/j.nimb.2008.10.074

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We discuss general characteristics of the resonant X-ray scattering and briefly illustrate its applications in atomic, molecular and solid state physics by a few selected examples. The Ljubljana high resolution spectrometer set-up is presented, which was recently employed at ELETTRA and ESRF synchrotron beamlines to study X-ray emission of inner-shell excited states of xenon and argon, and of simple sulfur containing molecules and solid compounds. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：221 / 225

页数：5

共 18 条

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