Scanning X-ray microscopy with large solid angle X-ray fluorescence detection at the XUV beamline P04, DESY

被引：1

作者：

Andrianov, K. ^{[1
]}

Haidl, A. ^{[1
]}

Luehl, L. ^{[1
]}

Dehlinger, A. ^{[2
]}

Dierks, H. ^{[2
]}

Gnewkow, R. ^{[2
]}

Nisius, T. ^{[1
]}

Kanngiesser, B. ^{[2
]}

Wilhein, T. ^{[1
]}

机构：

[1] Univ Appl Sci Koblenz, Inst X Opt, RheinAhrCampus,Joseph Rovan Allee 2, D-53424 Remagen, Germany

[2] Tech Univ Berlin, Inst Opt & Atom Phys, Hardenbergstr 36, D-10623 Berlin, Germany

来源：

JOURNAL OF INSTRUMENTATION | 2018年 / 13卷

关键词：

Instrumentation for synchrotron radiation accelerators; X-ray fluorescence (XRF) systems;

D O I：

10.1088/1748-0221/13/05/C05013

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The presented scanning transmission X-ray microscope (STXM), built on top of a modular platform, combines soft X-ray transmission and fluorescence microscopy with high detection efficiency and high spatial resolution. The setups user concept as well as the large solid angle (> 1 sr) of the integrated Silicon-drift-detector are unique characteristics of this endstation. In combination with the soft X-ray beamline P04 at PETRA III (DESY), it delivers a new type of nanoscope, providing a high flexibility and very low acquisition times.

引用

页数：6

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