Optical filter for fabricating self-aligned amorphous Si TFTs

被引:4
作者
Mei, P [1 ]
Lu, JP [1 ]
Chua, C [1 ]
Ho, J [1 ]
Wang, Y [1 ]
Boyce, JB [1 ]
机构
[1] Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA
来源
AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999 | 1999年 / 557卷
关键词
D O I
10.1557/PROC-557-677
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-aligned structures for bottom-gate amorphous Si TFTs provide a number of advantages, including reduced parasitic capacitance, smaller device dimensions, and improved uniformity in device performance for large-area electronics. A difficult challenge in making self-aligned TFT structures is the necessity of making source/drain contacts that exhibit low contact resistances and that are precisely aligned relative to the gate electrode. In this article, we describe a novel process for fabricating self-aligned amorphous Si TFTs. This process utilizes a pulsed excimer laser (308 nm) to dope or to activate dopants in a-Si to form the source/drain contacts. An important feature of the device design is an optical filter to protect the a-Si channel region from radiation damage during the 308 nm laser process. However, the optical filter allows the transmission of the uv light for lithography exposure from the backside of the substrate to align the channel region with the gate electrode. This new process enables the fabrication of high performance self-aligned a-Si TFTs with poly-Si source and drain contacts.
引用
收藏
页码:677 / 682
页数:6
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