Laboratory total reflection X-ray fluorescence analysis for low concentration samples

被引：16

作者：

Hampai, D. ^{[1
]}

Dabagov, S. B. ^{[1
,2
]}

Polese, C. ^{[1
,3
]}

Liedl, A. ^{[1
,4
]}

Cappuccio, G. ^{[1
]}

机构：

[1] INFN LNF, XLab Frascati, I-00044 Frascati, Italy

[2] Univ MEPhI, RAS PN Lebedev Phys Inst & Nat Res Nucl, Moscow, Russia

[3] Univ Roma La Sapienza, Dip DICMA, I-00185 Rome, Italy

[4] Univ Roma 3, Dip Sci Geol, Rome, Italy

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2014年 / 101卷

关键词：

Polycapillary optics; X-ray fluorescence; Total external reflection; Low-concentration elemental analysis; ICE CORE; OPTICS;

D O I：

10.1016/j.sab.2014.07.020

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Quantitative elemental determination for concentrations in the ppb range requires a careful preparation of the sample. In particular, for elemental analysis of very low concentration samples, less than 1 ng/mm(2), a very bright X-ray source, typically synchrotron radiation (SR) in total external reflection fluorescence regime (SR-TXRF), is required. Here, we wish to demonstrate that a conventional source combined with a polycapillary semi-lens can provide a quasi-parallel beam intense enough for desktop TXRF analysis of low concentration samples. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：114 / 117

页数：4

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