Laboratory total reflection X-ray fluorescence analysis for low concentration samples

被引：16
|
作者：
Hampai, D. [1 ]
Dabagov, S. B. [1 ,2 ]
Polese, C. [1 ,3 ]
Liedl, A. [1 ,4 ]
Cappuccio, G. [1 ]
机构：
[1] INFN LNF, XLab Frascati, I-00044 Frascati, Italy
[2] Univ MEPhI, RAS PN Lebedev Phys Inst & Nat Res Nucl, Moscow, Russia
[3] Univ Roma La Sapienza, Dip DICMA, I-00185 Rome, Italy
[4] Univ Roma 3, Dip Sci Geol, Rome, Italy
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2014年 / 101卷
关键词：
Polycapillary optics; X-ray fluorescence; Total external reflection; Low-concentration elemental analysis; ICE CORE; OPTICS;
D O I：
10.1016/j.sab.2014.07.020
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Quantitative elemental determination for concentrations in the ppb range requires a careful preparation of the sample. In particular, for elemental analysis of very low concentration samples, less than 1 ng/mm(2), a very bright X-ray source, typically synchrotron radiation (SR) in total external reflection fluorescence regime (SR-TXRF), is required. Here, we wish to demonstrate that a conventional source combined with a polycapillary semi-lens can provide a quasi-parallel beam intense enough for desktop TXRF analysis of low concentration samples. (C) 2014 Elsevier B.V. All rights reserved.
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页码：114 / 117
页数：4
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