Two mode photon bunching effect as witness of quantum criticality in circuit QED

被引:21
作者
Ai Qing [1 ]
Wang YingDan [2 ]
Long GuiLu [1 ,3 ]
Sun ChangPu [4 ]
机构
[1] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
[2] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland
[3] Tsinghua Natl Lab Informat Sci & Technol, Beijing 100084, Peoples R China
[4] Chinese Acad Sci, Inst Theoret Phys, Beijing 100080, Peoples R China
来源
SCIENCE IN CHINA SERIES G-PHYSICS MECHANICS & ASTRONOMY | 2009年 / 52卷 / 12期
基金
中国国家自然科学基金;
关键词
quantum phase transition; photon bunching; circuit QED; ENTANGLEMENT;
D O I
10.1007/s11433-009-0274-z
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We suggest a scheme to probe critical phenomena at a quantum phase transition (OPT) using the quantum correlation of two photonic modes simultaneously coupled to a critical system. As an experimentally accessible physical implementation, a circuit QED system is formed by a capacitively coupled Josephson junction qubit array interacting with one superconducting transmission line resonator (TLR). It realizes an Ising chain in the transverse field (ICTF) which interacts with the two magnetic modes propagating in the TLR. We demonstrate that in the vicinity of criticality the originally independent fields tend to display photon bunching effects due to their interaction with the ICTF. Thus, the occurrence of the OPT is reflected by the quantum characteristics of the photonic fields.
引用
收藏
页码:1898 / 1905
页数:8
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