Worst-case uncertainty measurement in ADC-based instruments

被引：15

作者：

Attivissimo, F. ^{[1
]}

Giaquinto, N. ^{[1
]}

Savino, M. ^{[1
]}

机构：

[1] Polytech Bari, Dept Elect & Elect, I-70125 Bari, Italy

来源：

COMPUTER STANDARDS & INTERFACES | 2007年 / 29卷 / 01期

关键词：

measurement uncertainty; measurement error; A/D converters;

D O I：

10.1016/j.csi.2005.12.002

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The paper gives formulae for evaluating the uncertainty of measurements (both "direct" and "indirect") performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The formulae allow one to evaluate the measurement uncertainty with any given level of confidence, including the special case (when applicable) of 100% or "worst-case" uncertainty. The results are intended as a contribution towards a standard way of writing and using ADC specifications. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：5 / 10

页数：6

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