Influences of graded superlattice on the electrostatic discharge characteristics of green InGaN/GaN light-emitting diodes

被引:10
作者
Lee, Kwanjae [1 ,2 ,3 ]
Lee, Cheul-Ro [1 ,2 ]
Chung, Tae-Hoon [3 ]
Park, Jinyoung [3 ]
Leem, Jae-Young [4 ]
Jeong, Kwang-Un [5 ,6 ]
Kim, Jin Soo [1 ,2 ]
机构
[1] Chonbuk Natl Univ, Div Adv Mat Engn, Jeonju 561756, South Korea
[2] Chonbuk Natl Univ, RCAMD, Jeonju 561756, South Korea
[3] Korea Photon Technol Inst, Gwangju 500779, South Korea
[4] Inje Univ, Sch Nano Engn, Gimhae 621749, South Korea
[5] Chonbuk Natl Univ, Dept Polymer Nano Sci & Technol, Jeonju 561756, South Korea
[6] Chonbuk Natl Univ, Polymer Mat Fus Res Ctr, Jeonju 561756, South Korea
基金
新加坡国家研究基金会;
关键词
Electrostatic discharge; Superlattices; Metalorganic vapor phase epitaxy; Light emitting diodes; NITRIDE-BASED LEDS; MQW LEDS; PROTECTION;
D O I
10.1016/j.jcrysgro.2017.02.003
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this paper, the influence of a Si-doped graded superlattice (SiGSL) on the electrostatic discharge (ESD) characteristics of green InGaN/GaN light-emitting diodes (LEDs) is discussed. To investigate the effects of Si doping to the superlattice, green LEDs were also fabricated on undoped graded superlattice (unGSL). Furthermore, a conventional green InGaN/GaN LED without the superlattice (C-LED), emitting at a wavelength of 534 nm, was also prepared as a reference. The current-voltage (I-V) curves for the C-LED and the unGSL-LED subjected to the ESD treatments at surge voltages from 2000 to 8000 V showed a drastic increase in the leakage current. However, there was relatively small change in the I-V curves for the SiGSL-LED after the ESD treatments, even at the surge voltages of 6000 and 8000 V. After the ESD treatment at a surge voltage of 8000 V, the EL intensities for the C-LED, unGSL, and SiGSL, measured at a driving current of 120 mA, were reduced by 55, 53, and 30%, respectively, compared to those of the as-fabricated LEDs.
引用
收藏
页码:138 / 142
页数:5
相关论文
共 18 条
[1]   Improved ESD protection by combining InGaN-GaN MQW LEDs with GaN Schottky diodes [J].
Chang, SJ ;
Chen, CH ;
Su, YK ;
Sheu, JK ;
Lai, WC ;
Tsai, JM ;
Liu, CH ;
Chen, SC .
IEEE ELECTRON DEVICE LETTERS, 2003, 24 (03) :129-131
[2]   High electrostatic discharge protection of InGaN/GaN MQW LEDs by using GaN Schottky diodes [J].
Chen, CH ;
Chang, SJ ;
Su, YK .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2003, 200 (01) :91-94
[3]   Improved ESD voltage by inserting floating metal ring in GaN-based light emitting diodes [J].
Hwang, S. ;
Shim, J. .
ELECTRONICS LETTERS, 2008, 44 (09) :590-+
[4]   The effect of the internal capacitance of InGaN-light emitting diode on the electrostatic discharge properties [J].
Jeon, Soo-Kun ;
Lee, Jae-Gab ;
Park, Eun-Hyun ;
Jang, Jin ;
Lim, Jae-Gu ;
Kim, Seo-Kun ;
Park, Joong-Seo .
APPLIED PHYSICS LETTERS, 2009, 94 (13)
[5]   Influences of Si-doped graded short-period superlattice on green InGaN/GaN light-emitting diodes [J].
Lee, Kwanjae ;
Lee, Cheul-Ro ;
Lee, Jin Hong ;
Chung, Tae-Hoon ;
Ryu, Mee-Yi ;
Jeong, Kwang-Un ;
Leem, Jae-Young ;
Kim, Jin Soo .
OPTICS EXPRESS, 2016, 24 (07) :7743-7751
[6]   Electrostatic Discharge Characteristics of InGaN/GaN Light-Emitting Diodes with Si-Doped Graded Superlattice [J].
Lee, Kwanjae ;
Lee, Cheul-Ro ;
Kim, Jin Soo ;
Lee, Jin Hong ;
Lim, Kee Young ;
Leem, Jae-Young .
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2015, 15 (10) :7733-7737
[7]   Effects of Dislocations on the Carrier Transport and Optical Properties of GaN Films grown with an in-situ SiNx Insertion Layer [J].
Lee, Yong Seok ;
Chung, Sang Jo ;
Suh, Eun-Kyung .
ELECTRONIC MATERIALS LETTERS, 2012, 8 (02) :141-146
[8]   Reliability study on green InGaN/GaN light emitting diodes [J].
Li, Z. L. ;
Lai, P. T. ;
Choi, H. W. .
16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS, 2010, 209
[9]   Highly ESD-reliable, nitride-based heterostructure p-i-n photodetectors with a p-AlGaN blocking layer [J].
Liu, C. H. ;
Lam, T. K. ;
Ko, T. K. ;
Chang, S. J. ;
Sun, Y. X. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2008, 155 (04) :H232-H234
[10]   Enhanced luminescence of InGaN/GaN multiple quantum wells by strain reduction [J].
Niu Nanhui ;
Wang Huaibing ;
Liu Jianping ;
Liu Naixin ;
Xing Yanhui ;
Han Jun ;
Deng Jun ;
Shen Guangdi .
SOLID-STATE ELECTRONICS, 2007, 51 (06) :860-864