Atom-resolved image of the TiO2(110) surface by noncontact atomic force microscopy

被引：218

作者：

Fukui, K ^{[1
]}

Onishi, H ^{[1
]}

Iwasawa, Y ^{[1
]}

机构：

[1] UNIV TOKYO,GRAD SCH SCI,DEPT CHEM,BUNKYO KU,TOKYO 113,JAPAN

来源：

PHYSICAL REVIEW LETTERS | 1997年 / 79卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.79.4202

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Atom-resolved images of a TiO2(110)-(1 X 1) surface were obtained by noncontact atomic force microscopy (NC-AFM) in ultrahigh vacuum. in contrast to previous scanning tunneling microscopy studies, outermost atoms of bridge-bound oxygen ridges were observed as protruding rows by NC-AFM. A high-resolution image of the surface revealed that the bridging oxygen atoms ordered in (1 X 1) periodicity on terraces. Point defects of oxygen atoms were also imaged as dark spots.

引用

页码：4202 / 4205

页数：4

共 33 条

[1] THEORETICAL INTERPRETATION OF ATOMIC-FORCE-MICROSCOPE IMAGES OF GRAPHITE [J].

ABRAHAM, FF ;

BATRA, IP .

SURFACE SCIENCE, 1989, 209 (1-2) :L125-L132

[2] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[3] Study of clean TiO2(110) surface by scanning tunneling microscopy and spectroscopy [J].

Berko, A ;

Solymosi, F .

LANGMUIR, 1996, 12 (05) :1257-1261

[4] Relaxation of TiO2(110)-(1x1) using surface X-ray diffraction [J].

Charlton, G ;

Howes, PB ;

Nicklin, CL ;

Steadman, P ;

Taylor, JSG ;

Muryn, CA ;

Harte, SP ;

Mercer, J ;

McGrath, R ;

Norman, D ;

Turner, TS ;

Thornton, G .

PHYSICAL REVIEW LETTERS, 1997, 78 (03) :495-498

[5] Evidence for the tunneling site on transition-metal oxides: TiO2(110) [J].

Diebold, U ;

Anderson, JF ;

Ng, KO ;

Vanderbilt, D .

PHYSICAL REVIEW LETTERS, 1996, 77 (07) :1322-1325

[6] THE GEOMETRIC STRUCTURE OF INTRINSIC DEFECTS AT TIO2(110) SURFACES - AN STM STUDY [J].

FISCHER, S ;

MUNZ, AW ;

SCHIERBAUM, KD ;

GOPEL, W .

SURFACE SCIENCE, 1995, 337 (1-2) :17-30

[7] ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].

GIESSIBL, FJ .

SCIENCE, 1995, 267 (5194) :68-71

[8] Surface structure of (1x2) reconstructed TiO2(110) studied using electron stimulated desorption ion angular distribution [J].

Guo, Q ;

Cocks, I ;

Williams, EM .

PHYSICAL REVIEW LETTERS, 1996, 77 (18) :3851-3854

[9] Simultaneous imaging of Si(111) 7x7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode [J].

Guthner, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (04) :2428-2431

[10]

Henrich V. E. C. P. A., 1994, SURFACE SCI METAL OX

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