Determination of the residual stress depth profile of uniaxial compacted ruthenium powder samples by X-ray diffraction

被引：7
作者：
Angerer, P. [1 ]
Neubauer, E. [2 ]
Yu, L. G. [3 ]
Khor, Khiam Aik [3 ]
机构：
[1] Ctr Electrochem Surface Technol, A-2700 Wiener Neustadt, Austria
[2] Austrian Res Ctr GmbH ARC, A-2444 Seibersdorf, Austria
[3] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
来源：
INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS | 2009年 / 27卷 / 06期
关键词：
Spark-plasma-sintering; Ruthenium; Residual stress; Grazing incidence X-ray diffraction; PLASMA-SINTERING SPS; GRADIENTS;
D O I：
10.1016/j.ijrmhm.2009.07.006
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ruthenium samples with a cylindrical shape have been prepared by means of the Spark-Plasma-Sintering (SPS) process at sintering temperatures between 1200 degrees C and 1600 degrees C and a corresponding sintering time of 1 min. Similar samples were obtained by conventional hot-pressing process methods at 1200 degrees C and 1400 degrees C for 60 min. The residual stress components sigma(11) and sigma(33) directed parallel and vertical to the compaction axis have been determined on the plane terminal face of these samples by means of the grazing incidence sin(2)psi method. The variation of the angle of incidence between 1 degrees and 10 degrees permitted diffraction measurements at a mean depth of X-ray penetration up to 0.6 mu m. The depth profiles of the residual stress were subsequently deduced. (C) 2009 Elsevier Ltd. All rights reserved.
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收藏
页码：1004 / 1008
页数：5
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