Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

被引：14

作者：

Kim, Jungho ^{[1
]}

Ellis, D. S. ^{[1
]}

Zhang, H. ^{[1
]}

Kim, Young-June ^{[1
]}

Hill, J. P. ^{[2
]}

Chou, F. C. ^{[3
]}

Gog, T. ^{[4
]}

Casa, D. ^{[4
]}

机构：

[1] Univ Toronto, Dept Phys, Toronto, ON M5S 1A7, Canada

[2] Brookhaven Natl Lab, Dept Condensed Matter Phys & Mat Sci, Upton, NY 11973 USA

[3] MIT, Ctr Mat Sci & Engn, Cambridge, MA 02139 USA

[4] Argonne Natl Lab, XOR, Adv Photon Source, Argonne, IL 60439 USA

来源：

PHYSICAL REVIEW B | 2009年 / 79卷 / 09期

基金：

加拿大自然科学与工程研究理事会;

关键词：

bismuth compounds; copper compounds; dielectric losses; ellipsometry; lanthanum compounds; strontium compounds; X-ray scattering; ELECTRONIC-STRUCTURE; EXCITATIONS; SPECTROSCOPY; DEPENDENCE;

D O I：

10.1103/PhysRevB.79.094525

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2CuO4, CuGeO3, Sr2Cu3O4Cl2, La2CuO4, and Sr2CuO2Cl2, and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi2CuO4 and CuGeO3.

引用

页数：5

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