Evaluation of Cutting Ability of Electroplated Diamond Wire Using a Test System and Theoretical Approach

被引:14
作者
Kim, Do-Yeon [1 ]
Lee, Tae-Kyung [1 ]
Park, Chul-Jin [1 ]
Lee, Sang-Jik [1 ]
Jeong, Hae-Do [2 ]
Kim, Hyoung-Jae [1 ]
机构
[1] Korea Inst Ind Technol, Precis Mfg & Control R&D Grp, 42-7,Baegyang Daero 804Beon Gil, Busan 46938, South Korea
[2] Pusan Natl Univ, Grad Sch Mech Engn, 2,Busandaehak Ro 63Beon Gil, Busan 46241, South Korea
关键词
Cutting; Diamond tool; Wire saw; WAFER;
D O I
10.1007/s12541-018-0067-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electroplated diamond wire has been used to cut hard materials, such as sapphire, silicon carbide, silicon. The cutting ability of the electroplated diamond wire strongly influences the accuracy of the shape and cutting speed. The evaluation of cutting ability of the electroplated diamond wire is important to predict and determine its cutting performance. However, the cutting ability has not been adequately evaluated due to a variation in the manufacturing methods and irregular distribution of the abrasives. A cutting ability curve is proposed base on a mathematical model and experimental results achieved through a test system to evaluate the performance of the electroplated diamond wire. The results showed that the cutting ability of the electroplated diamond wire could be characterized by the cutting ability curve proposed in this study.
引用
收藏
页码:553 / 560
页数:8
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