On the use of the 16O(4He,4He)16O resonance for the evaluation of radiation damage in oxides

被引:8
作者
Thomé, L
Gentils, A
Jagielski, J
Enescu, SE
Garrido, F
机构
[1] CNRS, IN2P3, Ctr Spectrometrie Nucl & Spectrometrie Masse, F-91405 Orsay, France
[2] Inst Elect Mat Technol, PL-01919 Warsaw, Poland
[3] Soltan Inst Nucl Studies, PL-05400 Otwock, Poland
[4] Horia Hulubei Natl Inst Phys & Nucl Engn, Bucharest 76900, Romania
关键词
oxides; irradiation; radiation damage; RBS; resonant scattering; channeling;
D O I
10.1016/j.nimb.2004.01.035
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper deals with the evaluation of the radiation damage induced in the various sublattices of oxide single crystals submitted to irradiation with energetic ions. The study is focused on the depth distribution of the disorder (disorder profile) and the variation of the disorder as a function of the ion fluence (disordering kinetics). More specificaily we discuss the pertinence of the use of the standard RBS or of the O-16(He-4,He-4)O-16 resonance at 3.04 MeV for the study of the anionic sublattice in oxides with different cation masses. The experimental results obtained on several binary oxides indicate that the RBS mode is better suited for the study of oxides with low cation mass (e.g. SiO2), whereas the resonant mode is more adapted to the study of oxides with high cation mass (e.g. UO2) In the medium mass region (illustrated by ZrO2), either the RBS or the resonant modes can be used depending whether the disorder profile or the disordering kinetics are evaluated. (C) 2004 Elsevier B.V. All rights reserved.
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页码:99 / 104
页数:6
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