Fourier transform spectrometer for spectral emissivity measurement in the temperature range between 60 and 1500°C

被引：43

作者：

Dai, Jingmin ^{[1
]}

Wang, Xinbei ^{[1
]}

Yuan, Guibin ^{[1
]}

机构：

[1] Harbin Inst Technol, POB 308, Harbin 150001, Peoples R China

来源：

7th International Symposium on Measurement Technology and Intelligent Instruments | 2005年 / 13卷

关键词：

D O I：

10.1088/1742-6596/13/1/015

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

A new spectral emissivity measurement system has been developed at Harbin Institute of Technology (HIT) by using a Fourier transform infrared (FTIR) spectrometer. The spectral range between 0.6 and 25 mu m was covered by a photovoltaic HgCdTe and a silicon photodiode detector. A SiC heater with a black hole was employed for heating the sample. The temperature of the sample can be controlled in a range between 60 and 1500 degrees C with an error of less than 1 degrees C. The system was calibrated against two high quality reference blackbodies: a low temperature heat-pipe blackbody operated in the temperature range between 60 degrees C and 300 degrees C and a high temperature blackbody with SiC heater operated in the temperature range between 300 degrees C and 1500 degrees C. Several tests were done for this new system. The estimated uncertainty of emissivity measurement is better than 3%.

引用

页码：63 / 66

页数：4

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