Error Detection of Data Conversion in Flash ADC using Code Width Based Technique

被引:2
|
作者
Sivakumar, Senthil M. [1 ]
Gurumekala, T. [2 ]
Pulya, Sruthi [1 ]
机构
[1] Vignans Fdn Sci Res & Technol, Guntur, Andhra Pradesh, India
[2] Anna Univ, Madras Inst Technol, Chennai, Tamil Nadu, India
来源
2ND INTERNATIONAL CONFERENCE ON RECENT TRENDS IN ADVANCED COMPUTING ICRTAC -DISRUP - TIV INNOVATION , 2019 | 2019年 / 165卷
关键词
ADC; dynamic comparator; TIQ; DNL; INL;
D O I
10.1016/j.procs.2020.01.078
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
The high integration density of the complex electronic system requires the multi-functional testing facility to ensure the accuracy of the circuit function. In addition, the wide population of submicron technologies results in the persistent requirements of high precision analog and mixed-signal (AMS) circuits. In the complex, high-density circuits, observing the correctness of output are limited due to the limitations of input and output pins which develop the AMS circuit test as very difficult and expensive. A digital built-in self-test (BIST) scheme has been presented in this paper for testing an analog to digital converter (ADC) in the time domain. The testing scheme consists of the linear analog ramp generator, ADC as a circuit under test, output response analyzer and a BIST controller. Bootstrap linear ramp generator is used to generate the linear analog ramp signal which is applied to ADC to develop the digital word sequence for testing. Among various types of ADCs, here a Flash ADC has used since it is fastest and accurate in digital conversion. A Flash ADC has been designed with the seven-bit resolution and tested using the proposed digital BIST scheme. The ADC comprises a sample-hold circuit, 2(N)-1 comparator, XOR gates, and encoder block. The output response analyzer verifies the digital output sequence to validate the static test parameters of ADC called monotonicity, missing codes, DNL, and INL error. The BIST controller generates the control signals to control the test sequence. The complete test sequence of ADC BIST has simulated in Tanner EDA with TSMC 0.18um technology. ORA is used to analyze the presence of monotonicity, missing codes, DNL and INL error in the ADC output. (C) 2019 The Authors. Published by Elsevier B.V.
引用
收藏
页码:270 / 277
页数:8
相关论文
共 50 条
  • [21] A 4 GS/s, 1.8 V Multiplexer encoder based Flash ADC using TIQ Technique.
    Nazir, Liyaqat
    Mir, Roohie Naaz
    Hakim, Najeeb-ud-din
    2014 INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING AND INTEGRATED NETWORKS (SPIN), 2014, : 458 - 463
  • [22] A software-based error detection technique using encoded signatures
    Sedaghat, Yasser
    Miremadi, Seyed Ghassem
    Fazeli, Mahdi
    21ST IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2006, : 389 - +
  • [23] TEMPERATURE SENSOR RESISTANCE CONVERSION TO BINARY CODE USING PULSE WIDTH MODULATION
    Vostrukhin, Aleksandr
    Vakhtina, Elena
    18TH INTERNATIONAL SCIENTIFIC CONFERENCE ENGINEERING FOR RURAL DEVELOPMENT, 2019, : 1269 - 1274
  • [24] Design of Novel Multiplexer Based Thermometer to Binary Code Encoder for 4 Bit Flash ADC
    Mayur, S. Marinaik
    2017 2ND IEEE INTERNATIONAL CONFERENCE ON RECENT TRENDS IN ELECTRONICS, INFORMATION & COMMUNICATION TECHNOLOGY (RTEICT), 2017, : 1006 - 1009
  • [25] Structural Function Based Code Clone Detection Using A New Hybrid Technique
    Yang, Yanming
    Ren, Zhilei
    Chen, Xin
    Jiang, He
    2018 IEEE 42ND ANNUAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE (COMPSAC), VOL 1, 2018, : 286 - 291
  • [26] An Error Codes Detection Based Background Calibration for Split SAR ADC
    Huang, Rulin
    Shao, Leilai
    Wang, Wuguang
    Sun, Guoquan
    Zhu, Xiaolei
    PROCEEDINGS OF THE 2015 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2015, : 150 - 153
  • [27] Optical scheme of developing Hamming code-based error detection and correction using Toffoli gates with frequency encoded data
    Garai, Manas Kumar
    Mandal, Dhoumendra
    Mandal, Mrinal Kanti
    Garai, Sisir Kumar
    OPTICAL ENGINEERING, 2022, 61 (12)
  • [28] A low-power 100MS/s Flash ADC with Thermometer code encoding technique for automotive applications
    Golda, D. Persiya Gnana
    Sam, D. S. Shylu
    Paul, P. Sam
    Jayanthi, D.
    PRZEGLAD ELEKTROTECHNICZNY, 2024, 100 (10): : 84 - 88
  • [29] Error Detection and Correction Using Decimal Matrix Code: Survey
    Santhia, T. Evangeline
    Bharathi, R. Helen Ramya
    Revathy, M.
    2017 IEEE INTERNATIONAL CONFERENCE ON ELECTRICAL, INSTRUMENTATION AND COMMUNICATION ENGINEERING (ICEICE), 2017,
  • [30] Visual robust oblivious watermarking technique using error correcting code
    Kung, C. M.
    Troung, T. K.
    2006 10TH INTERNATIONAL CONFERENCE ON COMMUNICATION TECHNOLOGY, VOLS 1 AND 2, PROCEEDINGS, 2006, : 1433 - +