AN EXTENDED ANALYSIS OF ALONG-TRACK ANTENNA PATTERN COMPENSATION FOR SAR ALTIMETRY

被引：0

作者：

Scagliola, Michele ^{[1
]}

Dinardo, Salvatore ^{[2
]}

Fornari, Marco ^{[3
]}

机构：

[1] ARESYS SRL, Via Flumendosa 16, Milan, Italy

[2] Serco ESRIN, Frascati, Italy

[3] ESA ESTEC, Noordwijk, Netherlands

来源：

2015 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM (IGARSS) | 2015年

关键词：

Altimetry; Synthetic Aperture Radar; CryoSat;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

One of the main benefits of the along-track processing in Synthetic Aperture Radar altimetry [1] is the speckle reduction that is achieved by averaging all the observations accumulated for a same scattering area. Being the different observations obtained by looking at the same scattering area from different positions of the instrument along the orbit, they result to be modulated by the along-track antenna pattern. By compensating the along-track antenna pattern before averaging, a higher speckle reduction can be achieved. This paper is aimed at presenting this processing method and at evaluating the possible improvement in the sense of the effective number of looks and of the precision of the physical parameters retrieved from the power waveforms.

引用

页码：1238 / 1241

页数：4

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