Critical point and vapor pressure measurements at high temperatures by means of a new apparatus with ultralow residence times

A new flow method has been employed to obtain critical point and vapor pressure data at high temperatures for four compounds: squalane, toluene, ethylbenzene, and styrene. This new flow method allows the determination of reliable critical points and vapor pressures for thermally unstable or otherwise reactive compounds. The critical point is inferred from other measurements in the critical region. The measurement accuracy is less than that obtained by more conventional methods, but this method has been used where conventional methods fail.