Enhanced α-axis-oriented crystal growth of Nd-substituted bismuth titanate thin films with layer-by-layer crystallization

被引：15

作者：

Chen, YC ^{[1
]}

Sun, YM ^{[1
]}

Lin, CP ^{[1
]}

Gan, JY ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30043, Taiwan

来源：

JOURNAL OF CRYSTAL GROWTH | 2004年 / 268卷 / 1-2期

关键词：

surface structure; X-ray diffraction; polycrystalline deposition; ferroelectric materials;

D O I：

10.1016/j.jcrysgro.2004.05.010

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Nd-substituted bismuth titanate (Bi3.5Nd0.5Ti3O12, BNdT) films were prepared on Pt electrodes using chemical solution deposition. Enhanced a-axis-oriented crystal growth occurred when the crystallization was performed on every spin-coated layer with sufficiently thin thickness (similar to 20 nm). The remnant polarization (2P(r) similar to 38 muC/cm(2)) of the film derived by such a layer-by-layer crystallization method was significantly higher than that of the film derived with the conventional process (2P(r)similar to10 muC/cm(2)). Examination of structural evolution has indicated that, owing to the geometrical effect, the growth of (1 1 7)-oriented crystals was restricted by the layer thickness, while the growth of a-axis-oriented crystals was not. As a result, BNdT films prepared by layer-by-layer crystallization are dominated by a-axis-oriented crystals and show high remnant polarization. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：210 / 214

页数：5

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