Metrological characteristics of wavelet filter used for engineering surfaces

The functional behavior of manufactured surfaces is influenced by the errors such as roughness, waviness and form errors that are present on the surface. A filtering process is used to establish a three-dimensional reference surface consisting of waviness and form errors and the roughness component is separated with reference to it. The metrological characteristics of a filter are better understood in terms of wavelength content and phase information. In this paper, metrological characteristics of wavelet filter suggested for processing of engineering surfaces are discussed. A few typical manufactured surfaces and their reference surfaces established by wavelet filter are further analyzed by random process techniques to bring out the waviness content and phase matching. (C) 2006 Elsevier Ltd. All rights reserved.