Vibration analysis of layered structured by opto-electronics methods

被引:0
作者
Spagnolo, GS [1 ]
Pappalardo, M [1 ]
Iula, A [1 ]
Carotenuto, R [1 ]
Majo, R [1 ]
Ambrosini, D [1 ]
Paoletti, D [1 ]
机构
[1] Univ Roma Tre, Dipartimento Ingn Elettr, I-00146 Rome, Italy
来源
FIFTH INTERNATIONAL CONFERENCE ON VIBRATION MEASUREMENTS BY LASER TECHNIQUES: ADVANCES AND APPLICATIONS | 2002年 / 4827卷
关键词
Electronic Speckle Pattern Interferometry; ESPI; vibration analysis; mode shape; piezoelectric plate vibration; optical metrology;
D O I
10.1117/12.468151
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Today, the vibration analysis of laminated structures represents an important field in engineering metrology. To perform non-invasive vibration measurements in industrial environments, optical methods are a preferable choice. Electronic Speckle Pattern Interferometry is a method, which permits full field and non-contacting displacement or deformation measurements. The experimental measurement of the resonant frequencies for the piezoceramic material is generally performed by impedance analysis. In this work, Electronic Speckle Pattern Interferometry (ESPI) technique is proposed for studying vibration of piezoceramic/nickel circular laminated plates. The circular membrane is a composite made of a nickel alloy disk with thickness 0.1 mm and diameter 32 mm, to which a piezoceramic disk, with the same thickness and a smaller diameter (24 mm) is bonded. The time average frame subtraction technique is improved by subtracting two Bessel fringe patterns at two different amplitude levels. A brief analysis of the techniques and some preliminary experimental tests are presented.
引用
收藏
页码:331 / 340
页数:10
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