Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

被引:5
作者
Kim, Ji Hee [1 ]
Srolovitz, David J.
Cha, Pil-Ryung
Yoon, Jong-Kyu
机构
[1] Princeton Univ, Dept Mech & Aerosp Engn, Princeton, NJ 08544 USA
[2] Yeshiva Univ, Dept Phys, New York, NY 10033 USA
[3] Kookmin Univ, Sch Adv Mat Engn, Seoul 136702, South Korea
[4] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2336488
中图分类号
O59 [应用物理学];
学科分类号
摘要
Morphology evolution of asperity contacts in microelectromechanical systems switches is examined in the framework of the phase field method. Surface mass diffusion, driven by capillarity, rapidly increases the asperity contact radius at early times, decreases it slowly at later times, and, possibly, pinches off the contact due to a Rayleigh instability. Electromigration accelerates this process but retards or prevents the pinch off at late times. The evolution occurs faster when the asperity size and/or density are smaller. Approximate analytical results for the evolution kinetics are provided. (c) 2006 American Institute of Physics.
引用
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页数:8
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