Investigations into local piezoelectric properties by atomic force microscopy

被引：52

作者：

Durkan, C ^{[1
]}

Chu, DP ^{[1
]}

Migliorato, P ^{[1
]}

Welland, ME ^{[1
]}

机构：

[1] Univ Cambridge, Dept Engn, Nanoscale Sci Grp, Cambridge CB2 1PZ, England

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 03期

关键词：

D O I：

10.1063/1.125756

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We describe nanoscale characterization of sol-gel produced ferroelectric thin films of lead-zirconate-titanate. We have performed quantitative localized measurements of surface polarization charge density using atomic force microscopy techniques in conjunction with electric field calculations. We show that domains with radii of 40 nm may by written and subsequently characterized, and we analyze the dependence of domain size on write voltage and write time, and show that surface contaminants influence the formation of domains. (C) 2000 American Institute of Physics. [S0003-6951(00)04003-1].

引用

页码：366 / 368

页数：3

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