Mechanical Properties and Microstructure of Sn-Based Solder Joints at Cryogenic Temperature

被引:0
作者
Du, Xue [1 ]
Tian, Yanhong [1 ]
Zhao, Xin [1 ]
机构
[1] Harbin Inst Technol, State Key Lab Adv Welding & Joining, Harbin 150006, Peoples R China
来源
2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2014年
关键词
cryogenic temperature; mechanical properties; tin whisker; TIN WHISKER FORMATION; RELIABILITY;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work was designed for low-temperature mechanical properties of the solder joints, the temperature is 293K, 223K, 173K, and 123K, in order to get the mechanical strength and mechanism of fracture at low temperature; Cryogenic temperature (77K) storage experiment is applied to get microstructure of internal solder joint, and the evolution of IMC and other microstructures, as well as solder joints' mechanical properties, failure modes and failure mechanisms The results show that tensile strength of the solder joints increases first and then decreases along with the decreasing temperature, 63Sn37Pb/Cu and 62Sn36Pb2Ag/Ag joints reach their maximum strength at 173K and 223K respectively. Cryogenic temperature storage has no effect on IMC growing, but tin whisker is found in some parts of 63Sn37Pb/Cu and 62Sn36Pb2Ag/Cu solder joints stored for 10 days, without appearance in solder joints that stored for 20 days and those lead-free solder jonits. Sn whisker is random and unpredictable.
引用
收藏
页码:888 / 892
页数:5
相关论文
共 16 条
[1]   Reliability assessment of indium solder for low temperature electronic packaging [J].
Chang, Rui W. ;
McCluskey, F. Patrick .
CRYOGENICS, 2009, 49 (11) :630-634
[2]   The study of mechanical properties of Sn-Ag-Cu lead-free solders with different Ag contents and Ni doping under different strain rates and temperatures [J].
Che, F. X. ;
Zhu, W. H. ;
Poh, Edith S. W. ;
Zhang, X. W. ;
Zhang, X. R. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2010, 507 (01) :215-224
[3]  
Del Castillo L., 2006, P 4 INT PLAN PROB WO
[4]   Improved reliability of copper-cored solder joints under a harsh thermal cycling condition [J].
Kim, Yunsung ;
Choi, Hyelim ;
Lee, Hyoungjoo ;
Shin, Dongjun ;
Cho, Jinhan ;
Choe, Heeman .
MICROELECTRONICS RELIABILITY, 2012, 52 (07) :1441-1444
[5]   The effect of strain rate and temperature on the tensile properties of Sn-3.5Ag solder [J].
Lang, FQ ;
Tanaka, H ;
Munegata, O ;
Taguchi, T ;
Narita, T .
MATERIALS CHARACTERIZATION, 2005, 54 (03) :223-229
[6]  
Lupinacci A, 2013, ADV PACK MAT APM 201, P82
[7]   Thermomechanical fatigue damage evolution in SAC solder joints [J].
Matin, M. A. ;
Vellinga, W. P. ;
D Geers, M. G. .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2007, 445 :73-85
[8]   Recent observations on tin pest formation in solder alloys [J].
Plumbridge, W. J. .
JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (02) :218-223
[9]   Tin pest issues in lead-free electronic solders [J].
Plumbridge, W. J. .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) :307-318
[10]   Minimization of tin whisker formation for lead-free electronics finishing [J].
Schetty, R. .
Circuit World, 2001, 27 (02) :17-20