Resolution function for two-axis specular neutron reflectivity

被引：11

作者：

Bouwman, WG

Pedersen, JS

机构：

[1] Department of Solid State Physics, Risø National Laboratory

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1996年 / 29卷

关键词：

D O I：

10.1107/S0021889895012751

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The resolution function for specular neutron reflectivity measurements of flat samples is calculated. The results are also applicable to some X-ray reflectivity set-ups. In a basic approach, the contributions of the wavelength spread and the angular divergence are calculated. The method of combining these contributions is discussed. These calculations are compared with some measured reflectivity curves. The calculations are checked with an analytical beam analysis method that takes directly into account the coupling between the angle, position and wavelength of the neutrons.

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页码：152 / 158

页数：7

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