Characterization and Calibration of PILATUS Detectors

被引：156

作者：

Kraft, P. ^{[1
]}

Bergamaschi, A. ^{[1
]}

Broennimann, Ch. ^{[2
]}

Dinapoli, R. ^{[1
]}

Eikenberry, E. F. ^{[2
]}

Graafsma, H. ^{[3
]}

Henrich, B. ^{[1
]}

Johnson, I. ^{[1
]}

Kobas, M. ^{[2
]}

Mozzanica, A. ^{[1
]}

Schlepuetz, C. A. ^{[1
]}

Schmitt, B. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] DECTRIS Ltd, CH-5400 Baden, Switzerland

[3] DESY, HASYLAB, D-22603 Hamburg, Germany

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 03期

关键词：

Hybrid pixel detector; single photon counting; threshold calibration; threshold dispersion; threshold trimming; noise; RADIATION; CHIP;

D O I：

10.1109/TNS.2008.2009448

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Pilatus is a silicon hybrid pixel detector system for detecting X-rays in single photon counting mode. The PILATUS II chip, fabricated in a radiation tolerant design with a standard 0.25 mu m CMOS process, was used to construct multichip modules with a size of 84 x 34 mm(2) comprising 94'965 pixels. All calibrations and characterizations were carried out with monochromatic X-rays from a synchrotron source. In order to set any required threshold above the noise level between 2.14 keV and 22 keV the detector was calibrated with X-rays. An algorithm to adjust thresholds pixel-by-pixel and create trim files,based on X-ray flat-field images was developed. The threshold dispersion was reduced from 343 eV to 36 eV by the means of trim files. An electronic noise of 447 eV has been measured. The PELATUS modules are suitable for various X-ray applications such as diffraction and imaging techniques.

引用

页码：758 / 764

页数：7

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