Continuity equation based nonquasi-static charge model for independent double gate MOSFET

被引:2
作者
Sharan, Neha [1 ]
Mahapatra, Santanu [1 ]
机构
[1] Indian Inst Sci, Dept Elect Syst Engn, Nano Scale Device Res Lab, Bangalore 560012, Karnataka, India
关键词
Compact modeling; Nonquasi static (NQS) effect; Double gate (DG) MOSFET; SIGNAL SIMULATIONS; LINEARIZATION; DESIGN;
D O I
10.1007/s10825-013-0540-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using the numerical device simulation we show that the relationship between the surface potentials along the channel in any double gate (DG) MOSFET remains invariant in QS (quasistatic) and NQS (nonquasi-static) condition for the same terminal voltages. This concept along with the recently proposed 'piecewise charge linearization' technique is then used to develop the intrinsic NQS charge model for a Independent DG (IDG) MOSFET by solving the governing continuity equation. It is also demonstrated that unlike the usual MOSFET transcapacitances, the inter-gate transcapacitance of a IDG-MOSFET initially increases with the frequency and then saturates, which might find novel analog circuit application. The proposed NQS model shows good agreement with numerical device simulations and appears to be useful for efficient circuit simulation.
引用
收藏
页码:353 / 359
页数:7
相关论文
共 20 条
  • [1] [Anonymous], 2010, MATLAB LANG TECHN CO, VR2010a
  • [2] [Anonymous], 2010, 2010 INT EL DEV M SA
  • [3] ATLAS, ATLAS DEV SIM FRAM V
  • [4] Dessai G., 2012, IEEE T ELECTRON DEV, V59, P2019
  • [5] Piecewise Linearization Technique for Compact Charge Modeling of Independent DG MOSFET (vol 59, pg 1974, 2012)
    Jandhyala, Srivatsava
    Abraham, Aby
    Anghel, Costin
    Mahapatra, Santanu
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (01) : 518 - 518
  • [6] Piecewise Linearization Technique for Compact Charge Modeling of Independent DG MOSFET
    Jandhyala, Srivatsava
    Abraham, Aby
    Anghel, Costin
    Mahapatra, Santanu
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (07) : 1974 - 1979
  • [7] A Simple Charge Model for Symmetric Double-Gate MOSFETs Adapted to Gate-Oxide-Thickness Asymmetry
    Jandhyala, Srivatsava
    Kashyap, Rutwick
    Anghel, Costin
    Mahapatra, Santanu
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (04) : 1002 - 1007
  • [8] BSIM-IMG: A Compact Model for Ultrathin-Body SOI MOSFETs With Back-Gate Control
    Khandelwal, Sourabh
    Chauhan, Yogesh Singh
    Lu, Darsen D.
    Venugopalan, Sriramkumar
    Ul Karim, Muhammed Ahosan
    Sachid, Angada Bangalore
    Nguyen, Bich-Yen
    Rozeau, Olivier
    Faynot, Olivier
    Niknejad, Ali M.
    Hu, Chenming Calvin
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (08) : 2019 - 2026
  • [9] Liu W., 2011, BSIM4 and MOSFET Modeling for IC Simulation
  • [10] Demonstration, analysis, and device design considerations for independent DG MOSFETs
    Masahara, M
    Liu, YX
    Sakamoto, K
    Endo, K
    Matsukawa, T
    Ishii, K
    Sekigawa, T
    Yamauchi, H
    Tanoue, H
    Kanemaru, S
    Koike, H
    Suzuki, E
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (09) : 2046 - 2053