Theoretical study of triple junction electron emission for a new type of cold cathode

被引：0
作者：
Chung, M. S. [1 ]
Bae, H. K. [1 ]
Jang, Y. J. [1 ]
Cutler, R. H. [2 ]
Miskovsky, N. M. [2 ]
机构：
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
[2] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
来源：
2006 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE HELD JOINTLY WITH 2006 IEEE INTERNATIONAL VACUUM ELECTRON SOURCES | 2006年
关键词：
triple junction; cold cathode; field emission; field enhancement;
D O I：
10.1109/IVELEC.2006.1666201
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Enhanced Field emission at the contact Of metal and dielectric is theoretically investigated by making analytic and numerical calculations of the electric field near the triple junction of metal-dielectric-vacuum. It is also found that this enhancement is responsible for the vacuum breakdown. The present results suggest that the triple junction can be a candidate for a new type of cold cathode.
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页码：95 / +
页数：2
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