Reliability assessment in active distribution networks with detailed effects of PV systems

被引:44
作者
Esau, Zulu [1 ]
Jayaweera, Dilan [1 ]
机构
[1] Curtin Univ, Dept Elect & Comp Engn, Perth, WA 6845, Australia
基金
中国国家自然科学基金;
关键词
Distribution network planning; Insolation variation; Mathematical model; Strategic integration; EDUCATIONAL PURPOSES;
D O I
10.1007/s40565-014-0046-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the increased integration of photovoltaic (PV) power generation into active distribution networks, the operational challenges and their complexities are increased. Such networks need detailed characterization PV systems under multiple operating conditions to understand true impacts. This paper presents a new mathematical model for a PV system to capture detailed effects of PV systems. The proposed model incorporates state transitions of components in a PV system and captures effects of insolation variations. The paper performs a reliability assessment incorporating PV systems at resource locations. The results suggest that the reliability performance of an active distribution network at stressed operating conditions might be influenced by the high penetration of PV system. Reliability performance of distribution networks that are high penetrated with PV systems can be affected by cloudy effects resulting from insolation variations. The proposed model can be used to quantify the level of reduction in reliability, resulting with cloudy effects.
引用
收藏
页码:59 / 68
页数:10
相关论文
共 21 条
  • [1] A RELIABILITY TEST SYSTEM FOR EDUCATIONAL PURPOSES - BASIC DISTRIBUTION-SYSTEM DATA AND RESULTS
    ALLAN, RN
    BILLINTON, R
    SJARIEF, I
    GOEL, L
    SO, KS
    [J]. IEEE TRANSACTIONS ON POWER SYSTEMS, 1991, 6 (02) : 813 - 820
  • [2] [Anonymous], 2009, Microgrids and Active Distribution Networks
  • [3] Reliability evaluation of customers in a microgrid
    Bae, In-Su
    Kim, Jin-O
    [J]. IEEE TRANSACTIONS ON POWER SYSTEMS, 2008, 23 (03) : 1416 - 1422
  • [4] Impact of Strategic Deployment of CHP-Based DERs on Microgrid Reliability
    Basu, Ashoke Kumar
    Chowdhury, Sunetra
    Chowdhury, S. P.
    [J]. IEEE TRANSACTIONS ON POWER DELIVERY, 2010, 25 (03) : 1697 - 1705
  • [5] Bie ZH, 2012, IEEE T POWER SYST, V27, P2342, DOI 10.1109/TPWRS.2012.2202695
  • [6] A RELIABILITY TEST SYSTEM FOR EDUCATIONAL PURPOSES - BASIC RESULTS
    BILLINTON, R
    KUMAR, S
    CHOWDHURY, N
    CHU, K
    GOEL, L
    KHAN, E
    KOS, P
    NOURBAKHSH, G
    OTENGADJEI, J
    [J]. IEEE TRANSACTIONS ON POWER SYSTEMS, 1990, 5 (01) : 319 - 325
  • [7] Billinton R, 1996, IEEE T POWER SYST, V11, P1670, DOI 10.1109/59.544626
  • [8] A RELIABILITY TEST SYSTEM FOR EDUCATIONAL PURPOSES - BASIC DATA
    BILLINTON, R
    KUMAR, S
    CHOWDHURY, N
    CHU, K
    DEBNATH, K
    GOEL, L
    KHAN, E
    KOS, P
    NOURBAKHSH, G
    OTENGADJEI, J
    [J]. IEEE TRANSACTIONS ON POWER SYSTEMS, 1989, 4 (03) : 1238 - 1244
  • [9] Billinton R., 1994, RELIABILITY EVALUATI, DOI DOI 10.1007/978-1-4615-7731-7
  • [10] Billinton R., 1983, RELIABILITY EVALUATI