Optimization of BRDF measurement method using Spectralon white reflectance standard

被引:0
|
作者
Tao, Hui-Rong [1 ]
Qu, Xing-Hua [1 ]
Zhang, Fu-Min [1 ]
Zhu, Yuan-Qing [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
来源
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS | 2013年 / 8916卷
关键词
reflectance; BRDF; white reflectance standard; scatter; error analysis; BIDIRECTIONAL REFLECTANCE;
D O I
10.1117/12.2035690
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There are two kinds of methods to measure the bidirectional reflectance distribution function (BRDF), direct method and relatively method. The relatively method is widely used because of its convenience and small error. However, the BRDF of the Spectralon white reflectance standard in relatively method was found to deviate from the Lambertian BRDF. It was found to vary with the angle of incidence, the wavelength of incidence and the states of polarization of the incident and reflected light. This paper proposes an optimized measurement formula of BRDF. The result is corrected. Taking the BRDF of standard roughness specimens for example, experimental results show that the measurement accuracy is improved comparing with the original formula. Finally the error analysis is carried out on the accuracy of measurement. The research has certain reference significance for the study of target characteristics on noncooperative target ranging.
引用
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页数:7
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