Optimization of BRDF measurement method using Spectralon white reflectance standard

被引:0
|
作者
Tao, Hui-Rong [1 ]
Qu, Xing-Hua [1 ]
Zhang, Fu-Min [1 ]
Zhu, Yuan-Qing [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
来源
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS | 2013年 / 8916卷
关键词
reflectance; BRDF; white reflectance standard; scatter; error analysis; BIDIRECTIONAL REFLECTANCE;
D O I
10.1117/12.2035690
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There are two kinds of methods to measure the bidirectional reflectance distribution function (BRDF), direct method and relatively method. The relatively method is widely used because of its convenience and small error. However, the BRDF of the Spectralon white reflectance standard in relatively method was found to deviate from the Lambertian BRDF. It was found to vary with the angle of incidence, the wavelength of incidence and the states of polarization of the incident and reflected light. This paper proposes an optimized measurement formula of BRDF. The result is corrected. Taking the BRDF of standard roughness specimens for example, experimental results show that the measurement accuracy is improved comparing with the original formula. Finally the error analysis is carried out on the accuracy of measurement. The research has certain reference significance for the study of target characteristics on noncooperative target ranging.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range
    Sanz, J. M.
    Extremiana, C.
    Saiz, J. M.
    APPLIED OPTICS, 2013, 52 (24) : 6051 - 6062
  • [2] Correction of the calibration measurement by taking into account the Spectralon™ spectro-polarimetric BRDF model
    Levesque, Martin P.
    Dissanska, Maria
    REFLECTION, SCATTERING, AND DIFFRACTION FROM SURFACES VI, 2018, 10750
  • [3] Bidirectional reflectance distribution function of Spectralon white reflectance standard illuminated by incoherent unpolarized and plane-polarized light
    Bhandari, Anak
    Hamre, Borge
    Frette, Ovynd
    Zhao, Lu
    Stamnes, Jakob J.
    Kildemo, Morten
    APPLIED OPTICS, 2011, 50 (16) : 2431 - 2442
  • [4] Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards
    Svensen, Oyvind
    Kildemo, Morten
    Maria, Jerome
    Stamnes, Jakob J.
    Frette, Oyvind
    OPTICS EXPRESS, 2012, 20 (14): : 15045 - 15053
  • [5] A general method to normalize Landsat reflectance data to nadir BRDF adjusted reflectance
    Roy, D. P.
    Zhang, H. K.
    Ju, J.
    Gomez-Dans, J. L.
    Lewis, P. E.
    Schaaf, C. B.
    Sun, Q.
    Li, J.
    Huang, H.
    Kovalskyy, V.
    REMOTE SENSING OF ENVIRONMENT, 2016, 176 : 255 - 271
  • [6] Evaluation of BRDF Archetypes for Representing Surface Reflectance Anisotropy Using MODIS BRDF Data
    Zhang, Hu
    Jiao, Ziti
    Dong, Yadong
    Li, Xiaowen
    REMOTE SENSING, 2015, 7 (06): : 7826 - 7845
  • [7] Diffuse spectral fundus reflectance measured using subretinally placed spectralon
    Salyer, David A.
    Denninghoff, Kurt R.
    Beaudry, Neil
    Basavanthappa, Sreenivasa
    Park, Robert I.
    Chipman, Russell A.
    JOURNAL OF BIOMEDICAL OPTICS, 2008, 13 (04)
  • [8] Measurement and modeling of Bidirectional Reflectance Distribution Function (BRDF) on material surface
    Wang, Hongyuan
    Zhang, Wei
    Dong, Aotuo
    MEASUREMENT, 2013, 46 (09) : 3654 - 3661
  • [9] Simulation method of reflectance measurement error using the OTDR
    Blanchard, P
    Dubard, J
    Ducos, L
    Thauvin, R
    IEEE PHOTONICS TECHNOLOGY LETTERS, 1998, 10 (05) : 705 - 706
  • [10] Bidirectional Reflectance Distribution Function (BRDF) Measurement of Materials Aged Under Simulated Space Environment
    Shah, Jainisha
    Badura, Gregory
    Hoffmann, Ryan
    Engelhart, Daniel
    JOURNAL OF THE ASTRONAUTICAL SCIENCES, 2024, 71 (01):