Possibility of experimental determination of band structure parameters in many-valley semiconductors

被引:1
作者
Vahanyan, A. I. [1 ]
Baghiyan, Y. M. [1 ]
机构
[1] Yerevan State Univ, Yerevan 375049, Armenia
关键词
many-valley semiconductor; band structure; charge carriers;
D O I
10.3103/S1068337214040057
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show possibility in principle to determine some parameters (density-of-states effective mass of different valleys, energy distances between valleys, energies of ionization of impurity levels split from different valleys) of the band structure in many-valley semiconductors, based on the experimental curve of temperature dependence of overall concentration of charge carriers.
引用
收藏
页码:165 / 167
页数:3
相关论文
共 3 条
[1]  
Blakemore J. S., 2002, Semiconductor Statistics
[2]  
TSIDILKOVSKII IM, 1978, ZONNAYA STRUKTURA PO
[3]  
Vahanyan A. I., 1982, FIZ TEKH POLUPROV, V16, P3