Particle monitoring method using acoustic emission signal for analysis of slider/disk/particle interaction

被引:21
|
作者
Chung, KH
Oh, JK
Moon, JT
Kim, DE
机构
[1] Yonsei Univ, Dept Mech Engn, Seodaemoon Ku, Seoul 120749, South Korea
[2] Korea Testing Lab, Measurement & Calibrat Ctr, Mech Measurement Team, Seoul 152848, South Korea
关键词
acoustic emission; frequency spectrum analysis; head/disk interaction; particle injection;
D O I
10.1016/j.triboint.2004.05.006
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
One of the most important reliability issues in an information storage device is the contamination problem. The slider and disk can be damaged by the particles intruded into the slider/disk interface (SDI). In this work, in order to monitor the slider/disk interaction due to particle injection the acoustic emission (AE) method, which is typically utilized for the detection of slider contact, was used. The raw as well as frequency spectrum of the AE signal were obtained during the particle injection test. The particles were artificially injected inside the test apparatus to simulate the effect of contamination on the slider/disk interaction. SiC and polystyrene particles were used for the tests. As a result, the 1st torsional and bending mode frequencies of the nano-slider were observed when I mun SiC particles and 60 nm polystyrene particles were injected into the SDI. Also, it was shown that the particle behavior at the SDI can be predicted from the characteristics of the AE raw signal. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:849 / 857
页数:9
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