Thickness-Invariant Complex Permittivity Retrieval from Calibration-Independent Measurements

被引：26
|
作者：
Hasar, Ugur C. [1 ]
机构：
[1] Gaziantep Univ, Elect & Elect Engn, TR-27310 Gaziantep, Turkey
来源：
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2017年 / 27卷 / 02期
关键词：
Calibration-independent; permittivity; thickness; PROPAGATION CONSTANT;
D O I：
10.1109/LMWC.2016.2647000
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A calibration-independent method is proposed for accurate complex permittivity (epsilon(r)) determination of dielectric samples from raw scattering parameter measurements without resorting to any information of thickness (L), especially for thinner samples. X-band waveguide measurements of two polyethylene samples were carried out for validation of our method. From our analysis, we note that while our method extracts similar epsilon(r) for both samples (thickness-invariant), accuracy of tested methods greatly degrades by an inaccurate knowledge of L.
引用
收藏
页码：201 / 203
页数：3
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