HIGH DYNAMIC RANGE CMOS-MEMS CAPACITIVE ACCELEROMETER ARRAY
被引:0
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作者:
Guney, Metin G.
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机构:
Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Guney, Metin G.
[1
]
Li, Xiaoliang
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机构:
Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Li, Xiaoliang
[1
]
Chung, Pey J.
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机构:
Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Chung, Pey J.
[1
]
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机构:
Paramesh, Jeyanandh
[1
]
Mukherjee, Tamal
论文数: 0引用数: 0
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机构:
Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Mukherjee, Tamal
[1
]
Fedder, Gary K.
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机构:
Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Carnegie Mellon Univ, Inst Robot, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
Fedder, Gary K.
[1
,2
]
机构:
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
[2] Carnegie Mellon Univ, Inst Robot, Pittsburgh, PA 15213 USA
来源:
2018 IEEE MICRO ELECTRO MECHANICAL SYSTEMS (MEMS)
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2018年
关键词:
SENSORS;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper reports on the design and characterization of a high-g CMOS-MEMS capacitive accelerometer array with 92 mG bias stability and +/- 50 kG designed input range with a validated 91 dB dynamic range. The on-chip integration of the read-out circuitry and the MEMS transducer minimizes sense-node parasitic capacitance, hence improving sensitivity and dynamic range. The small size and mass of individual accelerometer cells ensure high-g survivability. Averaging the signals from the accelerometer cells across the array improves the signal to noise ratio, hence improving the dynamic range.
机构:
Northeastern Univ, Dept Elect & Comp Engn, Dana Res Ctr 409, Boston, MA 02115 USANortheastern Univ, Dept Elect & Comp Engn, Dana Res Ctr 409, Boston, MA 02115 USA
Feng, Junpeng
Onabajo, Marvin
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机构:
Northeastern Univ, Dept Elect & Comp Engn, Dana Res Ctr 409, Boston, MA 02115 USANortheastern Univ, Dept Elect & Comp Engn, Dana Res Ctr 409, Boston, MA 02115 USA
Onabajo, Marvin
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
2014,
30
(01):
: 101
-
109
机构:
United Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab EmiratesUnited Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab Emirates
Mohan, Neethu
Abdelrahman, Diaaeldin
论文数: 0引用数: 0
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机构:
Assiut Univ, Fac Engn, Elect Engn Dept, Asyut 71515, Egypt
New Assiut Technol Univ, Coll Technol Ind & Energy, New Asyout City 71684, EgyptUnited Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab Emirates
Abdelrahman, Diaaeldin
Ali, Noor Faris
论文数: 0引用数: 0
h-index: 0
机构:
United Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab EmiratesUnited Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab Emirates
Ali, Noor Faris
Atef, Mohamed
论文数: 0引用数: 0
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机构:
United Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab EmiratesUnited Arab Emirates Univ, Coll Engn, Elect & Commun Engn Dept, Abu Dhabi, U Arab Emirates