Polarization and sectioning characteristic of THz confocal microscopy

被引：0

作者：

Wan, M. ^{[1
]}

Cibiraite, D. ^{[2
]}

Li, B. ^{[3
]}

Yuan, H. ^{[2
]}

Krozer, V ^{[2
,4
]}

Roskos, H. ^{[2
]}

Wang, D. ^{[3
]}

Sheridan, J. T. ^{[1
]}

机构：

[1] Univ Coll Dublin, Sch Elect & Elect Engn, Dublin 4, Ireland

[2] Goethe Univ Frankfurt, Phys Inst, D-60438 Frankfurt, Germany

[3] Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

[4] Univ Carlos III Madrid, Chair Excellence, Madrid, Spain

来源：

2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2019年

关键词：

D O I：

10.1109/irmmw-thz.2019.8874261

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Terahertz (THz) confocal scanning microscopy is the combination of THz technology and confocal scanning microscopy. Here, we present a conventional confocal THz imaging system with transmission configuration, which is implemented using an 300 GHz electronic terahertz source and a GaAs terahertz camera. The polarization and sectioning characterization arc demonstrated by utilizing a 2 mm resolution test stipes. The resulting images show consistently good resolution.

引用

页数：2

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