Polarization and sectioning characteristic of THz confocal microscopy

被引：0
|
作者：
Wan, M. [1 ]
Cibiraite, D. [2 ]
Li, B. [3 ]
Yuan, H. [2 ]
Krozer, V [2 ,4 ]
Roskos, H. [2 ]
Wang, D. [3 ]
Sheridan, J. T. [1 ]
机构：
[1] Univ Coll Dublin, Sch Elect & Elect Engn, Dublin 4, Ireland
[2] Goethe Univ Frankfurt, Phys Inst, D-60438 Frankfurt, Germany
[3] Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
[4] Univ Carlos III Madrid, Chair Excellence, Madrid, Spain
来源：
2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2019年
关键词：
D O I：
10.1109/irmmw-thz.2019.8874261
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Terahertz (THz) confocal scanning microscopy is the combination of THz technology and confocal scanning microscopy. Here, we present a conventional confocal THz imaging system with transmission configuration, which is implemented using an 300 GHz electronic terahertz source and a GaAs terahertz camera. The polarization and sectioning characterization arc demonstrated by utilizing a 2 mm resolution test stipes. The resulting images show consistently good resolution.
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页数：2
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