Mobile ambipolar domain in carbon-nanotube infrared emitters

被引:139
作者
Freitag, M [1 ]
Chen, J
Tersoff, J
Tsang, JC
Fu, Q
Liu, J
Avouris, P
机构
[1] IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Carbon Nanotechnol Inc, Houston, TX 77084 USA
[3] Duke Univ, Dept Chem, Durham, NC 27708 USA
关键词
D O I
10.1103/PhysRevLett.93.076803
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We spatially resolve the infrared light emission from ambipolar carbon-nanotube field-effect transistors with long-channel lengths. Electrons and holes are injected from opposite contacts into a single nanotube molecule. The ambipolar domain, where electron and hole currents overlap, forms a microscopic light emitter within the carbon nanotube. We can control its location by varying gate and drain voltages. At high electric fields, additional stationary spots appear due to defect-assisted Zener tunneling or impact ionization. The laterally resolved measurement provides valuable insight into the transistor behavior, complementary to electronic device characteristics.
引用
收藏
页码:076803 / 1
页数:4
相关论文
共 17 条
[1]   Current-carrying capacity of carbon nanotubes [J].
Anantram, MP .
PHYSICAL REVIEW B, 2000, 62 (08) :R4837-R4840
[2]   Carbon nanotube electronics [J].
Avouris, P ;
Appenzeller, J ;
Martel, R ;
Wind, SJ .
PROCEEDINGS OF THE IEEE, 2003, 91 (11) :1772-1784
[3]   Structure-assigned optical spectra of single-walled carbon nanotubes [J].
Bachilo, SM ;
Strano, MS ;
Kittrell, C ;
Hauge, RH ;
Smalley, RE ;
Weisman, RB .
SCIENCE, 2002, 298 (5602) :2361-2366
[4]  
Dresselhaus MS., 2000, CARBON NANOTUBES
[5]   Hot carrier electroluminescence from a single carbon nanotube [J].
Freitag, M ;
Perebeinos, V ;
Chen, J ;
Stein, A ;
Tsang, JC ;
Misewich, JA ;
Martel, R ;
Avouris, P .
NANO LETTERS, 2004, 4 (06) :1063-1066
[6]   Role of single defects in electronic transport through carbon nanotube field-effect transistors [J].
Freitag, M ;
Johnson, AT ;
Kalinin, SV ;
Bonnell, DA .
PHYSICAL REVIEW LETTERS, 2002, 89 (21)
[7]   High-mobility nanotube transistor memory [J].
Fuhrer, MS ;
Kim, BM ;
Durkop, T ;
Brintlinger, T .
NANO LETTERS, 2002, 2 (07) :755-759
[8]   A numerical study of scaling issues for Schottky-Barrier carbon nanotube transistors [J].
Guo, J ;
Datta, S ;
Lundstrom, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (02) :172-177
[9]  
Hertel T, 2002, APPL PHYS A-MATER, V75, P449, DOI 10.1007/S003390201415
[10]   Ultralong, well-aligned single-walled carbon nanotube architectures on surfaces [J].
Huang, SM ;
Maynor, B ;
Cai, XY ;
Liu, J .
ADVANCED MATERIALS, 2003, 15 (19) :1651-+