The Results of Thermal Expansion Investigation for Effective Thermoelectric Materials

被引：0
|
作者：
Shtern, Yury I. [1 ]
Rogachev, Maxim S. [1 ]
Bublik, Vladimir T. [2 ]
Tarasova, Irina V. [2 ]
Pozdniakov, Andrei V. [2 ]
机构：
[1] Natl Res Univ Elect Technol, Inst Adv Mat & Technol, Moscow, Russia
[2] Natl Univ Sci & Technol MISIS, Coll New Mat & Nanotechnol, Moscow, Russia
来源：
PROCEEDINGS OF THE 2019 IEEE CONFERENCE OF RUSSIAN YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING (EICONRUS) | 2019年
基金：
俄罗斯科学基金会;
关键词：
thermal expansion; dilatometer method; thermoelectric materials; thermal linear expansion coefficient; COEFFICIENT; DESIGN;
D O I：
10.1109/eiconrus.2019.8656804
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The thermal expansion of effective thermoelectric materials in the temperature range of 200-1200 K has been studied using quartz dilatometers. In present work the method and mathematical model for calculation of thermal linear expansion coefficients (TLEC) of thermoelectric materials were chosen and substantiated. As a result of the study, it was experimentally established that the TLEC of low temperature thermoelectric materials Bi2Te2.8Se0.2 and Bi0.5Sb1.5Te3 are 14.85.10(-6) K-1 and 14.98.10(-6) K-1 in the temperature range of 200-400 K respectively. Research of middle temperature materials was performed. It was found that the TLEC of Bi2Te2.4Se0.6 and Bi0.4Sb1.6Te3 weakly change in the working temperature range from 380 to 600 K and is in the range of (13.93-14.33).10(-6) K-1. Values of TLEC for PbTe is 23.07.10(-6) K-1, value of TLEC of GeTe is 24.47.10(-6) K-1 respectively. TLEC for high temperature nanostructural material Si0.8Ge0.2 is equal to 4.68.10(-6) K-1 in the temperature range 300-1200 K.
引用
收藏
页码：1932 / 1936
页数：5
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