Noncontact atomic force microscopy II

被引：2
|
作者：
Baykara, Mehmet Z. [1 ,2 ]
Schwarz, Udo D. [3 ,4 ,5 ]
机构：
[1] Bilkent Univ, Dept Mech Engn, TR-06800 Ankara, Turkey
[2] Bilkent Univ, UNAM Inst Mat Sci & Nanotechnol, TR-06800 Ankara, Turkey
[3] Yale Univ, Dept Mech Engn & Mat Sci, New Haven, CT 06520 USA
[4] Yale Univ, Dept Chem & Environm Engn, New Haven, CT 06520 USA
[5] Yale Univ, CRISP, New Haven, CT 06520 USA
来源：
BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 2014年 / 5卷
关键词：
atomic force microscopy; scanning force microscopy;
D O I：
10.3762/bjnano.5.31
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：289 / 290
页数：2
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