Test for the time independence of the fine structure constant, α, using cryogenic sapphire resonators at microwave frequencies

被引：0

作者：

Tobar, ME ^{[1
]}

Hartnett, JG ^{[1
]}

机构：

[1] Univ Western Australia, Dept Phys, Crawley, WA 6009, Australia

来源：

2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST | 2002年

关键词：

D O I：

10.1109/CPEM.2002.1034850

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new experiment to test for the time independence of the fine structure constant, a, is proposed. The experiment utilizes different polarized modes in a sapphire resonator. When configured as a dual mode sapphire clock, we show that it is possible to undertake a sensitive measurement from the beat frequency between the two modes.

引用

页码：320 / 320

页数：1