Determination of optical constants of scandium films in the 20-1000 eV range

被引：30
作者：
Fernandez-Perea, Monica
Larruquert, Juan I.
Aznarez, Jose A.
Mendez, Jos A.
Poletto, Luca
Malvezzi, A. Marco
Giglia, Angelo
Nannarone, Stefano
机构：
[1] CSIC, Inst Fis Aplicada, E-28006 Madrid, Spain
[2] CNR, Ist Nazl Fis Mat, Padua, Italy
[3] Dept Informat Engn, Padua, Italy
[4] Univ Pavia, Dipartimento Elettr, I-27100 Pavia, Italy
[5] INFM, I-27100 Pavia, Italy
[6] CNR, INFM, Lab Technol Avanzate & Nanosci, I-34012 Trieste, Italy
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2006年 / 23卷 / 11期
关键词：
D O I：
10.1364/JOSAA.23.002880
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Se layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Kronig analysis. Sum-rule tests indicated an acceptable consistency of the data. (c) 2006 Optical Society of America
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页码：2880 / 2887
页数：8
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