An improved experimental determination of external photoluminescence quantum efficiency

被引：1818

作者：

deMello, JC ^{[1
]}

Wittmann, HF ^{[1
]}

Friend, RH ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

ADVANCED MATERIALS | 1997年 / 9卷 / 03期

关键词：

D O I：

10.1002/adma.19970090308

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating-sphere method (see Figure) presented here. Spectrally resolved detection allows the excitation source and the emission to be distinguished. The method will be particularly useful for samples with small Stokes' shifts or low photoluminescence quantum yields or for highly scattering samples.

引用

页码：230 / &

页数：4

共 6 条

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