Bayesian process monitoring schemes for the two-parameter exponential distribution

被引:8
作者
van Zyl, R. [1 ]
van der Merwe, A. J. [1 ]
机构
[1] Univ Free State, Dept Math Stat & Actuarial Sci, Bloemfontein, Free State, South Africa
关键词
Bayesian procedure; Control chart; Jeffrey's prior; Run-length; Two-parameter exponential distribution; CONTROL CHARTS; RELIABILITY; PARAMETER; VARIANCE; PRIORS; LIMITS;
D O I
10.1080/03610926.2018.1440307
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
In this paper a Bayesian procedure is applied to obtain control limits for the location and scale parameters, as well as for a one-sided upper tolerance limit in the case of the two-parameter exponential distribution. An advantage of the upper tolerance limit is that it monitors the location and scale parameter at the same time. By using Jeffreys' non-informative prior, the predictive distributions of future maximum likelihood estimators of the location and scale parameters are derived analytically. The predictive distributions are used to determine the distribution of the "run-length" and expected "run-length". A dataset given in Krishnamoorthy and Mathew (2009) are used for illustrative purposes. The data are the mileages for some military personnel carriers that failed in service. The paper illustrates the flexibility and unique features of the Bayesian simulation method.
引用
收藏
页码:1766 / 1797
页数:32
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