Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations

被引:14
作者
Burch, Matthew J. [1 ]
Fancher, Chris M. [1 ]
Patala, Srikanth [1 ]
De Graef, Marc [2 ]
Dickey, Elizabeth C. [1 ]
机构
[1] North Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
EBSD; Ferroelectric; Ferroelectric domain; Electron backscatter diffraction; TRANSMISSION KIKUCHI DIFFRACTION; PIEZORESPONSE FORCE MICROSCOPY; BATIO3; ORIGIN; PHASE; EBSD;
D O I
10.1016/j.ultramic.2016.11.013
中图分类号
TH742 [显微镜];
学科分类号
摘要
A novel technique, which directly and nondestructively maps polar dorimins using electron backscatter diffraction (EBSD) is described and demonstrated. Through dynamical diffraction simulations and quantitative comparison to experimental EBSD patterns, the absolute orientation of a non-centrosymmetric crystal can be determined. With this information, the polar domains of a material can be mapped. The technique is demonstrated by mapping the non-ferroelastic, or 180 degrees ferroelectric domains in periodically poled LiNbO3 single crystals. Further, the authors demonstrate the possibility of mapping polarity using this technique in other polar materials system.
引用
收藏
页码:47 / 51
页数:5
相关论文
共 35 条
[1]  
[Anonymous], 2009, Transmission Electron Microscopy: A Textbook for Materials Science
[2]   DOMAIN CONFIGURATION AND EQUILIBRIUM SIZE OF DOMAINS IN BATIO3 CERAMICS [J].
ARLT, G ;
SASKO, P .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (09) :4956-4960
[3]   DIELECTRIC-PROPERTIES OF FINE-GRAINED BARIUM-TITANATE CERAMICS [J].
ARLT, G ;
HENNINGS, D ;
DEWITH, G .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (04) :1619-1625
[4]   Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity [J].
Balke, Nina ;
Maksymovych, Petro ;
Jesse, Stephen ;
Kravchenko, Ivan I. ;
Li, Qian ;
Kalinin, Sergei V. .
ACS NANO, 2014, 8 (10) :10229-10236
[5]   Domain wall contributions to the properties of piezoelectric thin films [J].
Bassiri-Gharb, Nazanin ;
Fujii, Ichiro ;
Hong, Eunki ;
Trolier-McKinstry, Susan ;
Taylor, David V. ;
Damjanovic, Dragan .
JOURNAL OF ELECTROCERAMICS, 2007, 19 (01) :49-65
[6]   Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate [J].
Burnett, T. L. ;
Weaver, P. M. ;
Blackburn, J. F. ;
Stewart, M. ;
Cain, M. G. .
JOURNAL OF APPLIED PHYSICS, 2010, 108 (04)
[7]   Raman and AFM piezoresponse study of dense BaTiO3 nanocrystalline ceramics [J].
Buscaglia, V ;
Buscaglia, MT ;
Viviani, M ;
Ostapchuk, T ;
Gregora, I ;
Petzelt, J ;
Mitoseriu, L ;
Nanni, P ;
Testino, A ;
Calderone, R ;
Harnagea, C ;
Zhao, Z ;
Nygren, M .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2005, 25 (12) :3059-3062
[8]   Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations [J].
Callahan, Patrick G. ;
De Graef, Marc .
MICROSCOPY AND MICROANALYSIS, 2013, 19 (05) :1255-1265
[9]   A Dictionary Approach to Electron Backscatter Diffraction Indexing [J].
Chen, Yu H. ;
Park, Se Un ;
Wei, Dennis ;
Newstadt, Greg ;
Jackson, Michael A. ;
Simmons, Jeff P. ;
De Graef, Marc ;
Hero, Alfred O. .
MICROSCOPY AND MICROANALYSIS, 2015, 21 (03) :739-752
[10]   Polarity determination of GaN films by ion channeling and convergent beam electron diffraction [J].
Daudin, B ;
Rouviere, JL ;
Arlery, M .
APPLIED PHYSICS LETTERS, 1996, 69 (17) :2480-2482