Orientation-dependent piezoelectricity and domain characteristics of tetragonal Pb(Zr0.3,Ti0.7)0.98Nb0.02O3 thin films on Nb-doped SrTiO3 substrates

被引：17

作者：

Yu, Qi ^{[1
]}

Li, Jing-Feng ^{[1
]}

Sun, Wei ^{[1
]}

Zhu, Fang-Yuan ^{[1
]}

Liu, Yuanming ^{[2
]}

Chen, Yanna ^{[3
]}

Wang, Zhanjie ^{[3
]}

Li, Jiangyu ^{[2
]}

机构：

[1] Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China

[2] Univ Washington, Dept Mech Engn, Seattle, WA 98195 USA

[3] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2014年 / 104卷 / 01期

基金：

美国国家科学基金会;

关键词：

PIEZORESPONSE FORCE MICROSCOPY; MORPHOTROPIC PHASE-BOUNDARY; LEAD-ZIRCONATE-TITANATE; ELECTRICAL-PROPERTIES; PB(ZR; TI)O-3; FILMS; CRYSTAL; POLARIZATION; CERAMICS;

D O I：

10.1063/1.4861469

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

For a better understanding of piezoelectricity in epitaxial film systems, epitaxially grown tetragonal Pb(Zr0.3Ti0.7)(0.98)Nb0.02O3 (PNZT) thin films with three primary crystallographic orientations were studied with a focus on their piezoelectric behaviors and domain configuration. Using piezoresponse force microscopy, the (001)-oriented epitaxial films were found to show superior piezoelectric properties compared with the (110)- and (111)-oriented films. This can be attributed to the structural characteristics of the tetragonal PNZT phase after applying an electrical field. Island-distributed domain shapes were also mapped for all three orientations. (C) 2014 AIP Publishing LLC.

引用

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