New extensive MVHR breakdown models

被引：8

作者：

Ribes, G. ^{[1
]}

Bruyere, S. ^{[1
]}

Roy, D. ^{[1
]}

Denais, M. ^{[1
]}

Roux, J-M. ^{[1
]}

Parthasarathy, C. ^{[1
]}

Huard, V. ^{[2
]}

Ghibaudo, G. ^{[3
]}

机构：

[1] STMicroelect, 850 Rue Jean Monnet, F-38926 Crolles, France

[2] Philips, F-38926 Crolles, France

[3] CNRS, IMEP, ENSERG, UMR 5531, Grenoble 38016, France

来源：

2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL | 2006年

关键词：

D O I：

10.1109/RELPHY.2006.251292

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：621 / +

页数：2

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